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XCF04SVOG20C 4 Mbit FPGA Configuration PROM
A 4 Mbit in-system programmable Platform Flash PROM for Xilinx FPGA configuration, featuring JTAG programming, up to 33 MHz serial data output, and a Pb-free 20-pin TSSOP package.
Compact SEM for University Labs
Compact SEM system designed for university laboratories and educational research. Easy operation, high imaging quality, and cost-effective SEM solution for teaching and scientific research.
Tabletop SEM for Materials Research
The ModuleSci PE-100 is a compact tabletop scanning electron microscope designed for materials research laboratories. Featuring a tungsten filament electron source, high-resolution imaging performance, and a motorized 5-axis stage, the system enables fast and accurate sample analysis for a wide range of materials science applications.
Surface Inspection Digital Microscope
The DMS-1000 Surface Inspection Digital Microscope is designed for detailed surface analysis and industrial inspection applications. Featuring ultra-depth 3D imaging and high-resolution digital observation, it enables accurate visualization of surface textures, structures, and material defects in real time.
Industrial Quality Control Microscope
The DMS-1000 Industrial Quality Control Microscope delivers high-resolution ultra-depth 3D imaging for industrial inspection and manufacturing quality assurance applications. It enables precise defect detection, component analysis, and surface inspection with real-time digital observation.
Semiconductor Inspection Microscope
The DMS-1000 Semiconductor Inspection Microscope is designed for high-precision semiconductor and wafer inspection applications. Featuring ultra-depth 3D digital imaging and high-resolution observation, it enables accurate analysis of chips, wafers, and semiconductor components in industrial and laboratory environments.
E-mail:
Address:
314 Techno 2-ro, Yuseong-gu, Daejeon 34036, Republic of Korea